Europe
UK : TTPCom selected the XJTAG development system as its boundary
scan test solution. The XJTAG system enables engineers at TTPCom's
headquarters in Cambridge, England, to diagnose and debug its wireless
development platforms, which contain a plethora of ball grid array
(BGA) devices and over 9,500 connections. XJTAG is also used by TTPCom's
contract manufacturing partners.
TTPCom selected the XJTAG
system predominantly to test and debug the numerous JTAG devices on
its development boards. These include five 1152-pin Xilinx field programmable
gate arrays (FPGAs), an ARM9 microprocessor control unit (MCU), a
high-speed digital signal processor (DSP), a clock controller and
a number of other programmable logic devices (PLDs).
"The XJTAG system
is a perfect fit for our development requirements as it enables us
to read and write to all of the device pins in the JTAG chain using
the XJAnalyser circuit visualisation tool," said Andrew Evans,
design engineer within TTPCom's silicon hardware group. "With
XJTAG, we can view the pin states on screen to quickly locate bridges,
breaks, poor joints or incorrect connections, and then isolate any
faulty device and rework or reflow it to rectify the problem."
TTPCom develops designs
for the full range of technologies required to deliver a successful
cellular handset from antenna to applications. The company delivers
tried and tested intellectual property for all components, enabling
manufacturers to build working models quickly and allowing them to
concentrate on value adding activities that differentiate their products.
TTPCom is actively engaged at all stages of handset development through
its worldwide collaboration with leading silicon manufacturers, software
vendors and handset manufacturers.
TTPCom's dual mode (2G
and 3G) pre-silicon development board is a mobile phone reference
platform with extensive development and debug capabilities built-in.
It is used by TTPCom to develop and warrant intellectual property
(IP), to demonstrate operations and assist with conformance testing.
The development platform is also used by customers for developing
their own silicon and software.
"It's important that
we get these complex development boards up and running quickly and
verify that each one is built according to the schematics as they
are used extensively across the business and cost many thousands of
dollars," says Jonathan Healy, design engineer at TTPCom. "XJTAG
has exceeded our expectations. Its unparalleled speed, accuracy and
ease-of-use have enabled us to shave days, if not weeks, off the development
phase of our wireless reference platforms - important factors in the
mobile phone industry where time-to-market is so critical."
The XJTAG boundary scan
development system meets the growing market need for a cost-effective
solution for testing printed circuit boards populated with JTAG devices
such as BGA and chip scale devices, which cannot be tested by traditional
methods such as flying probes, logic analyzers, oscilloscopes and
X-ray systems.
"XJTAG is designed
by engineers for engineers and represents a major advance in testing/debugging
techniques," added Andrew Evans. "We looked at other boundary
scan systems but opted for XJTAG due to the speed of fault diagnosis,
reusability of scripts, and because their engineers were prepared
to go that extra mile. In addition, because XJTAG abstracts engineers
from the level of the JTAG bitstream, it makes JTAG easier and more
intuitive to use."
The XJTAG Development
System is designed to cut the cost and shorten the development cycle
of electronic products and provides a unique solution that can test
JTAG as well as non-JTAG devices. XJTAG can test a high proportion
of a circuit including BGA and chip scale devices, SDRAMs, Ethernet
controllers, video interfaces, Flash memories, FPGAs, microprocessors
and many other devices. XJTAG also enables In-System Programming of
FPGAs, CPLDs (Complex Programmable Logic Devices) and Flash memories.
Pricing for the XJTAG system ranges from £3,500 (US$6,300) to
£9,000 (US$16,200).