Tektronix Joins LSTI for Trial Testing in 3G LTE Systems
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13th August , 2008

US : Tektronix Communications has been selected to join the Long Term Evolution/System Architecture Evolution (LTE/SAE) Trial Initiative (LSTI), a global, collaborative technology trial initiative focused on accelerating the availability of commercial and interoperable next generation LTE mobile broadband systems. The LSTI brings together major telecom equipment vendors and operators to drive the development of next-generation, high-performance, mobile broadband networks and 3rd Generation Partnership Project (3GPP) LTE and SAE technologies.

As a leading player in LTE test and measurement solutions, Tektronix' LTE solution portfolio includes the G35 Functional and Load Test Platform and the NSA Monitoring Platform which offer a comprehensive set of solutions focusing on effectively testing end-to-end network solutions to ensure that vendors and operators can test and verify LTE implementations as quickly and efficiently as possible. These platforms also include features such as air interface testing, multiple interface call trace and key performance statistics.

"We look forward to working with the world leading vendors and operators in the early phases of LTE deployment as a member of LSTI," said Martin Kuerzinger, General Manager, Mobile Diagnostics & Optimization Business Unit, Tektronix Communications. "We strongly believe that participation and collaboration in early trials will result in our continued ability to provide monitoring tools that exactly meet the verification, deployment and optimization requirements of operators."

Tektronix was selected for inclusion in LSTI based on its extensive history of valuable contributions, technology expertise and industry leadership in the test and measurement industry. As a member of LSTI, Tektronix will actively participate, support and assist in the LSTI initiatives to ensure the successful completion of projects. In addition, Tektronix will provide insight on the challenges that vendors face in efficiently testing new features and technologies ensuring reduced time to market, optimal performance and minimum out of pocket expenses (OPEX). More information can be found at http://www.tektronix.com/lte.



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